IEEE Design & Test
January/February 2003
http://computer.org/dt/

Articles

Features
Guest Editors' Introduction: Application-Specific Microprocessors
Alex Orailoglu and Alex Veidenbaum

A 100-GOPS Programmable Processor for Vehicle Vision Systems
Wolfgang Raab, Nico Bruels, Ulrich Hachmann, Jens Harnisch,
Ulrich Ramacher, Christian Sauer, and Axel Techmer

Application-Specific Instruction Memory Customizations for Power-Efficient
Embedded Processors
Peter Petrov and Alex Orailoglu

Compilation Approach for Coarse-Grained Reconfigurable Architectures
Jong-eun Lee, Kiyoung Choi, and Nikil D. Dutt

Instruction Scheduler Generation for Retargetable Compilation
Oliver Wahlen, Manuel Hohenauer, Rainer Leupers, and Heinrich Meyr

Special Features

Testing and Characterization of SDRAMs
Joerg E. Vollrath

2D Test Sequence Generators
Grzegorz Mrugalski, Jerzy Tyszer, and
Janusz Rajski

An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs
Florence Azais, Yves Bertrand, Michel Renovell, Andre Ivanov, and
Sassan Tabatabaei

Design Techniques for EEPROMs Embedded in Portable Systems on Chips
Jean Michel Daga, Caroline Papaix, Marc Merandat, Stephane Ricard,
Giuseppe Medulla, Jeanine Guichaoua, and Daniel Auvergne

Circuit-Level Considerations for Mixed-Signal Programmable Components
Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn,
Adao Antonio de Souza Jr., and Denis Teixeira Franco

Departments

EIC Message

The Road Ahead

Panel Summaries

Standards

Conference Reports

DATC Newsletter

TTTC Newsletter

The Last Byte

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